C. Christopoulos and J. L. Herring
20th Automated RF and Microwave Measurement Society (ARMMS) Conference, Nottingham UK, March 28-29 1994, paper 7.
One of the most challenging areas of high-frequency measurement is that associated with the tests and procedures required to demonstrate compliance with electromagnetic compatibility (EMC) regulations. These difficulties are due to the wide frequency range of these tests, the complexity of the test environments and the design of the equipment under test (EUT). In this short paper these difficulties are illustrated, together with a range of tools which may be employed to improve measurements.